Subheading 9031.41
EU TARICOptical measuring/checking instruments/appliances for inspecting semiconductor wafers/devices or photomasks/reticle used to mfg such devices
1 TARIC code
| TARIC Code | Description | Third-Country Duty |
|---|---|---|
| 9031.41.00.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 0.00 % |
Source: EU TARIC database (European Commission). For informational purposes only. Consult the official TARIC and a licensed customs broker for binding rates.