Subheading 9031.80
EU TARICElectron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor devices or reticles
2 TARIC codes
| TARIC Code | Description | Third-Country Duty |
|---|---|---|
| 9031.80.20.00 | For measuring or checking geometrical quantities | 0.00 % |
| 9031.80.80.00 | Other | 0.00 % |
Source: EU TARIC database (European Commission). For informational purposes only. Consult the official TARIC and a licensed customs broker for binding rates.