Subheading 9031.80
US HTSElectron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor devices or reticles
2 tariff lines
| HTS Code | Description | MFN Rate | Special |
|---|---|---|---|
| 9031.80.40 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor devices or reticles | Free | — |
| 9031.80.80 | Measuring and checking instruments, appliances and machines, nesoi | Free | — |
Source: US International Trade Commission (USITC). For informational purposes only. Consult the official HTS and a licensed customs broker for binding rates.